HORIBA Signature SPM 化学原子力显微镜

Signature SPM 结合了原子力显微镜的物理信息（形貌，电学，力学等）和拉曼/ PL 技术的化学成分信息（分子结构，能带带隙等），实现了多模态同区域成像。Signature SPM 真正意义上实现了对于样品多模态、全方位、实时地表征，大大提高了不同测量结果的关联性，从而提升了测试数据的可信度，加深科学研究的深度。这种创新技术为材料科学、纳米技术、生物医学研究等领域提供了强大的研究工具，使得科学家能够在纳米尺度上全面且深入的理解材料的性质和功能。

典型应用：材料、物理、化学、生物、半导体

All AFM modes included as standard

All AFM modes are included in the basic package of SignatureSPM: Kelvin Probe Microscopy, Piezo Response Force Microscopy, Magnetic Force Microscopy, Nanolithography, Force-curve Measurements.

Wide range spectrometer optimized for Raman and photoluminescence

Designed for spectroscopy imaging, the spectrometer of the SignatureSPM ensures minimal light loss with its achromatic design and impressive 95% light reflectivity. It provides a unique capability to perform accurate and efficient Raman and PL measurements thanks to its versatile design that can accommodate up to 3 gratings for a wide spectral range covering.

True co-localized measurements with "Probe away"

The software command "Probe away" moves the cantilever away from the sample's surface so that fully unobstructed confocal Raman maps can be obtained. With the "Probe back" command, the AFM tip will automatically return to its previous analysis point on the sample's surface.

Direct pathway to cantilever apex with high optical access

The optical pathways for AFM and spectroscopy are completely separated.

Such separation enables free choice of the Raman/Photoluminescence (PL) laser wavelength and simplifies the whole system adjustment. It also provides a very high magnification to visualize the AFM tip for better accuracy in positioning.

AFM for large scans and molecular resolution

The SignatureSPM offers exceptional AFM performance with stability and speed. thanks to its 100 x 100 x 15 micron-range scanner. It achieves large scans and molecular resolution, prioritizing stability through fast response time, low noise, low drift, and metrological traceability.

Quick and repeatable cantilever’s adjustment

Seamless tip exchange can be done regardless of the operator and with unmatched reproducibility. When the cantilever is replaced, the same spot on the sample surface can be easily found and scanned without any extra searching steps (within a few microns of repeatability).

Automated AFM registration system adjustment

Fully automated alignment of the laser, cantilever, and photodiode   is engineered for seamless integration with optical spectroscopy, and eliminates the need for user intervention.

No interference between AFM laser and spectroscopic measurements

The infrared AFM laser diode does not interfere with the visible Raman/PL excitation lasers and eliminates any parasitic influence on visible light-sensitive biological, semiconductor and photovoltaic samples.